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  • Application note
  • No. SEN001-IFCF-20230315-001

Published Online: Mar. 24th, 2023 

Thermal conductivity measurement of amorphous Ge1-xSnx thin films using frequency-domain thermoreflectance

  • Keywords
  • Semiconductor
  • Nanotechnology
  • Frequency-domain thermoreflectance
  • InFocus BB-FDTR

The thermal conductivities of amorphous Ge1-xSnx thin films with different Sn compositions were measured using frequency-domain thermoreflectance (FDTR). The results show that the thermal conductivity of the thin films decreases from 0.50 W/mK to 0.44 W/mK with increasing Sn composition, consistent with the amorphous limit calculated by the minimum thermal conductivity model.