- Application note
- No. SEN001-IFCF-20230315-001
Published Online: Mar. 24th, 2023
Thermal conductivity measurement of amorphous Ge1-xSnx thin films using frequency-domain thermoreflectance
- Frequency-domain thermoreflectance
- InFocus BB-FDTR
The thermal conductivities of amorphous Ge1-xSnx thin ﬁlms with diﬀerent Sn compositions were measured using frequency-domain thermoreﬂectance (FDTR). The results show that the thermal conductivity of the thin ﬁlms decreases from 0.50 W/mK to 0.44 W/mK with increasing Sn composition, consistent with the amorphous limit calculated by the minimum thermal conductivity model.